The broader project (including PIs from SIU) will result in improved understanding of the impacts of insect and disease pests that attack stems on soybean yield and quality. Our portion of the project is focused on dectes stem borer and soybean gall midge. Our survey will facilitate early detection of soybean gall midge should it ultimately end up in Illinois, improving our ability to respond to this potential invasive pest rapidly.
With dectes stem borer, we seek to better understand the distribution and relationship with yield loss of an insect that has received little attention in Illinois until relatively recently. Examining the timing of dectes stem borer development and injury to soybean could clarify why, despite injury to the vascular tissue of the stem, yield losses are typically minimal or nonexistent unless lodging of plants occurs. Better understanding the timing of larval injury relative to seed fill could reveal scenarios where physiological yield loss is likely to occur.